Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite

Martina Thomasová; Petr Sedlák; Hanuš Seiner; Michaela Janovská; Meni Kabla; Doron Shilo; Michal Landa

doi:10.1016/j.scriptamat.2015.01.009

Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite

Martina Thomasová, Petr Sedlák, Hanuš Seiner, Michaela Janovská, Meni Kabla, Doron Shilo, Michal Landa

Mechanical Engineering

Technion - Israel Institute of Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Young's moduli of 3 μm thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the austenite → R-phase → martensite transition sequence. The results prove that the smallest Young's modulus is attained for the R-phase, and both austenite and martensite exhibit pronounced softening towards the transition temperatures.

Original language	English
Pages (from-to)	24-27
Number of pages	4
Journal	Scripta Materialia
Volume	101
DOIs	https://doi.org/10.1016/j.scriptamat.2015.01.009
State	Published - 1 May 2015

Keywords

Elastic behavior
Martensitic phase transformation
Resonant ultrasound spectroscopy
Shape memory alloys
Sputtering

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys
General Materials Science

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10.1016/j.scriptamat.2015.01.009

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title = "Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite",

abstract = "Young's moduli of 3 μm thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the austenite → R-phase → martensite transition sequence. The results prove that the smallest Young's modulus is attained for the R-phase, and both austenite and martensite exhibit pronounced softening towards the transition temperatures.",

keywords = "Elastic behavior, Martensitic phase transformation, Resonant ultrasound spectroscopy, Shape memory alloys, Sputtering",

author = "Martina Thomasov{\'a} and Petr Sedl{\'a}k and Hanu{\v s} Seiner and Michaela Janovsk{\'a} and Meni Kabla and Doron Shilo and Michal Landa",

year = "2015",

month = may,

day = "1",

doi = "10.1016/j.scriptamat.2015.01.009",

language = "الإنجليزيّة",

volume = "101",

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journal = "Scripta Materialia",

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publisher = "American Chemical Society",

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T1 - Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy

T2 - Austenite, R-phase, and martensite

AU - Thomasová, Martina

AU - Sedlák, Petr

AU - Seiner, Hanuš

AU - Janovská, Michaela

AU - Kabla, Meni

AU - Shilo, Doron

AU - Landa, Michal

PY - 2015/5/1

Y1 - 2015/5/1

N2 - Young's moduli of 3 μm thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the austenite → R-phase → martensite transition sequence. The results prove that the smallest Young's modulus is attained for the R-phase, and both austenite and martensite exhibit pronounced softening towards the transition temperatures.

AB - Young's moduli of 3 μm thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the austenite → R-phase → martensite transition sequence. The results prove that the smallest Young's modulus is attained for the R-phase, and both austenite and martensite exhibit pronounced softening towards the transition temperatures.

KW - Elastic behavior

KW - Martensitic phase transformation

KW - Resonant ultrasound spectroscopy

KW - Shape memory alloys

KW - Sputtering

UR - http://www.scopus.com/inward/record.url?scp=84924531909&partnerID=8YFLogxK

U2 - 10.1016/j.scriptamat.2015.01.009

DO - 10.1016/j.scriptamat.2015.01.009

M3 - مقالة

SN - 1359-6462

VL - 101

SP - 24

EP - 27

JO - Scripta Materialia

JF - Scripta Materialia

ER -

Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite

Abstract

Keywords

All Science Journal Classification (ASJC) codes

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