X-ray-pulse characterization by spectral shearing interferometry using three-wave mixing

S. Yudovich; S. Shwartz

doi:https://doi.org/10.1103/physreva.90.033805

X-ray-pulse characterization by spectral shearing interferometry using three-wave mixing

S. Yudovich, S. Shwartz

Department of Physics

Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

Abstract

We describe a method for measuring the field profile of x-ray ultrashort pulses including phase information. The scheme is based on spectrally interfering two replicas of the same pulse, which are spectrally shifted via three-wave mixing with IR or visible beams. Using a single-shot spectrometer the scheme can be used for the inspection of individual ultrashort x-ray pulses with random amplitudes and phases. Examples for characterization of stochastic pulses with a bandwidth of 1 eV are given, including criteria for a successful measurement.

Original language	English
Article number	033805
Journal	Physical Review A - Atomic, Molecular, and Optical Physics
Volume	90
Issue number	3
DOIs	https://doi.org/10.1103/physreva.90.033805
State	Published - 3 Sep 2014

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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https://doi.org/10.1103/physreva.90.033805

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abstract = "We describe a method for measuring the field profile of x-ray ultrashort pulses including phase information. The scheme is based on spectrally interfering two replicas of the same pulse, which are spectrally shifted via three-wave mixing with IR or visible beams. Using a single-shot spectrometer the scheme can be used for the inspection of individual ultrashort x-ray pulses with random amplitudes and phases. Examples for characterization of stochastic pulses with a bandwidth of 1 eV are given, including criteria for a successful measurement.",

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AB - We describe a method for measuring the field profile of x-ray ultrashort pulses including phase information. The scheme is based on spectrally interfering two replicas of the same pulse, which are spectrally shifted via three-wave mixing with IR or visible beams. Using a single-shot spectrometer the scheme can be used for the inspection of individual ultrashort x-ray pulses with random amplitudes and phases. Examples for characterization of stochastic pulses with a bandwidth of 1 eV are given, including criteria for a successful measurement.

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X-ray-pulse characterization by spectral shearing interferometry using three-wave mixing

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