Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Baran Eren; U. Gysin; L. Marot; Th. Glatzel; R. Steiner; E. Meyer

doi:https://doi.org/10.1063/1.4940891

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Baran Eren, U. Gysin, L. Marot, Th. Glatzel, R. Steiner, E. Meyer

Research output: Contribution to journal › Article › peer-review

Abstract

Few layer graphene and graphite are simultaneously grown on a ∼100nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15eV with a variation of 50meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(π) hybridization.

Original language	English
Article number	041602
Journal	Applied Physics Letters
Volume	108
Issue number	4
DOIs	https://doi.org/10.1063/1.4940891
State	Published - 25 Jan 2016
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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title = "Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy",

abstract = "Few layer graphene and graphite are simultaneously grown on a ∼100nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15eV with a variation of 50meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(π) hybridization.",

author = "Baran Eren and U. Gysin and L. Marot and Th. Glatzel and R. Steiner and E. Meyer",

note = "Swiss Federal Office of Energy; Federal Office for Education and Science; Swiss National Foundation (SNF)",

year = "2016",

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doi = "https://doi.org/10.1063/1.4940891",

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T1 - Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

AU - Eren, Baran

AU - Gysin, U.

AU - Marot, L.

AU - Glatzel, Th.

AU - Steiner, R.

AU - Meyer, E.

N1 - Swiss Federal Office of Energy; Federal Office for Education and Science; Swiss National Foundation (SNF)

PY - 2016/1/25

Y1 - 2016/1/25

N2 - Few layer graphene and graphite are simultaneously grown on a ∼100nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15eV with a variation of 50meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(π) hybridization.

AB - Few layer graphene and graphite are simultaneously grown on a ∼100nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15eV with a variation of 50meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(π) hybridization.

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U2 - https://doi.org/10.1063/1.4940891

DO - https://doi.org/10.1063/1.4940891

M3 - مقالة

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VL - 108

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 041602

ER -

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Abstract

All Science Journal Classification (ASJC) codes

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