Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Baran Eren; U. Gysin; L. Marot; Th. Glatzel; R. Steiner; E. Meyer

doi:https://doi.org/10.1063/1.4940891

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Baran Eren, U. Gysin, L. Marot, Th. Glatzel, R. Steiner, E. Meyer

Research output: Contribution to journal › Article › peer-review

Abstract

Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.

Original language	English
Article number	041602
Number of pages	3
Journal	Applied Physics Letters
Volume	108
Issue number	4
DOIs	https://doi.org/10.1063/1.4940891
State	Published - 25 Jan 2016
Externally published	Yes

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title = "Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy",

abstract = "Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.",

author = "Baran Eren and U. Gysin and L. Marot and Th. Glatzel and R. Steiner and E. Meyer",

note = "Swiss Federal Office of Energy; Federal Office for Education and Science; Swiss National Foundation (SNF)",

year = "2016",

month = jan,

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doi = "https://doi.org/10.1063/1.4940891",

language = "الإنجليزيّة",

volume = "108",

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T1 - Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

AU - Eren, Baran

AU - Gysin, U.

AU - Marot, L.

AU - Glatzel, Th.

AU - Steiner, R.

AU - Meyer, E.

N1 - Swiss Federal Office of Energy; Federal Office for Education and Science; Swiss National Foundation (SNF)

PY - 2016/1/25

Y1 - 2016/1/25

N2 - Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.

AB - Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.

U2 - https://doi.org/10.1063/1.4940891

DO - https://doi.org/10.1063/1.4940891

M3 - مقالة

SN - 0003-6951

VL - 108

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 041602

ER -

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

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