Abstract
We report an ultra-shallow p-type doping of silicon resulting from the rapid thermal annealing of thin Al2O3 films deposited on intrinsic silicon with a native SiO2 layer, using a common atomic layer deposition process. Characterization revealed a two-stage decrease in sheet resistance, providing insights into the doping mechanism.
| Original language | English |
|---|---|
| Pages (from-to) | 11754-11757 |
| Number of pages | 4 |
| Journal | Chemical Communications |
| Volume | 60 |
| Issue number | 82 |
| DOIs | |
| State | Published - 25 Sep 2024 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Catalysis
- Ceramics and Composites
- General Chemistry
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry