Transient processing and analysis using AMPEL: Alert management, photometry, and evaluation of light curves

J. Nordin, V. Brinnel, J. Van Santen, M. Bulla, U. Feindt, A. Franckowiak, C. Fremling, A. Gal-Yam, M. Giomi, M. Kowalski, A. Mahabal, N. Miranda, L. Rauch, S. Reusch, M. Rigault, S. Schulze, J. Sollerman, R. Stein, O. Yaron, S. Van VelzenC. Ward

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