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Towards reflectometry from interreflections

Kfir Shem-Tov, Sai Praveen Bangaru, Anat Levin, Ioannis Gkioulekas

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Reflectometry is the task for acquiring the bidirectional reflectance distribution function (BRDFs) of real-world materials. The typical reflectometry pipeline in computer vision, computer graphics, and computational imaging involves capturing images of a convex shape under multiple illumination and imaging conditions; due to the convexity of the shape, which implies that all paths from the light source to the camera perform a single reflection, the intensities in these images can subsequently be analytically mapped to BRDF values. We deviate from this pipeline by investigating the utility of higher-order light transport effects, such as the interreflections arising when illuminating and imaging a concave object, for reflectometry. We show that interreflections provide a rich set of contraints on the unknown BRDF, significantly exceeding those available in equivalent measurements of convex shapes. We develop a differentiable rendering pipeline to solve an inverse rendering problem that uses these constraints to produce high-fidelity BRDF estimates from even a single input image. Finally, we take first steps towards designing new concave shapes that maximize the amount of information about the unknown BRDF available in image measurements. We perform extensive simulations to validate the utility of this reflectometry from interreflections approach.

Original languageEnglish
Title of host publicationIEEE International Conference on Computational Photography, ICCP 2020
ISBN (Electronic)9781728152301
DOIs
StatePublished - Apr 2020
Event2020 IEEE International Conference on Computational Photography, ICCP 2020 - Saint Louis, United States
Duration: 24 Apr 202026 Apr 2020

Publication series

NameIEEE International Conference on Computational Photography, ICCP 2020

Conference

Conference2020 IEEE International Conference on Computational Photography, ICCP 2020
Country/TerritoryUnited States
CitySaint Louis
Period24/04/2026/04/20

Keywords

  • Bidirectional reflectance distribution function
  • Differentiable rendering
  • Interreflections
  • Reflectometry

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Signal Processing
  • Media Technology
  • Instrumentation

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