Toward Quantum Optics with Free Electrons

Kangpeng Wang; Raphael Dahan; Saar Nehemia; Ori Reinhardt; Shai Tsesses; Ido Kaminer; Ofer Kfir; Hugo Lourenço-Martins; Armin Feist; Claus Ropers; Tobias J. Kippenberg

doi:10.1364/OPN.31.12.000035

Toward Quantum Optics with Free Electrons

Kangpeng Wang, Raphael Dahan, Saar Nehemia, Ori Reinhardt, Shai Tsesses, Ido Kaminer, Ofer Kfir, Hugo Lourenço-Martins, Armin Feist, Claus Ropers, Tobias J. Kippenberg

Technion - Israel Institute of Technology

Research output: Contribution to specialist publication › Article

Abstract

Electron microscopy and spectroscopy are ubiquitous in the investigation of materials and structures, providing a spatial resolution down to the atomic scale. Novel approaches with transmission electron microscopes, such as photo-induced near-fi eld electron microscopy (PINEM),1 use electron beams to characterize optical fi elds in matt er with deep subwavelength resolution.

Original language	English
Pages	35
Number of pages	1
Volume	31
No	12
Specialist publication	Optics and Photonics News
DOIs	https://doi.org/10.1364/OPN.31.12.000035
State	Published - 1 Dec 2020

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1364/OPN.31.12.000035

Cite this

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abstract = "Electron microscopy and spectroscopy are ubiquitous in the investigation of materials and structures, providing a spatial resolution down to the atomic scale. Novel approaches with transmission electron microscopes, such as photo-induced near-fi eld electron microscopy (PINEM),1 use electron beams to characterize optical fi elds in matt er with deep subwavelength resolution.",

author = "Kangpeng Wang and Raphael Dahan and Saar Nehemia and Ori Reinhardt and Shai Tsesses and Ido Kaminer and Ofer Kfir and Hugo Louren{\c c}o-Martins and Armin Feist and Claus Ropers and Kippenberg, \{Tobias J.\}",

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doi = "10.1364/OPN.31.12.000035",

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AU - Wang, Kangpeng

AU - Dahan, Raphael

AU - Nehemia, Saar

AU - Reinhardt, Ori

AU - Tsesses, Shai

AU - Kaminer, Ido

AU - Kfir, Ofer

AU - Lourenço-Martins, Hugo

AU - Feist, Armin

AU - Ropers, Claus

AU - Kippenberg, Tobias J.

PY - 2020/12/1

Y1 - 2020/12/1

N2 - Electron microscopy and spectroscopy are ubiquitous in the investigation of materials and structures, providing a spatial resolution down to the atomic scale. Novel approaches with transmission electron microscopes, such as photo-induced near-fi eld electron microscopy (PINEM),1 use electron beams to characterize optical fi elds in matt er with deep subwavelength resolution.

AB - Electron microscopy and spectroscopy are ubiquitous in the investigation of materials and structures, providing a spatial resolution down to the atomic scale. Novel approaches with transmission electron microscopes, such as photo-induced near-fi eld electron microscopy (PINEM),1 use electron beams to characterize optical fi elds in matt er with deep subwavelength resolution.

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DO - 10.1364/OPN.31.12.000035

M3 - مقالة

SN - 1047-6938

VL - 31

SP - 35

JO - Optics and Photonics News

JF - Optics and Photonics News

ER -

Toward Quantum Optics with Free Electrons

Abstract

All Science Journal Classification (ASJC) codes

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