Three-dimensional localization microscopy by deep learning

Elias Nehme, Boris Ferdman, Daniel Freedman, Lucien E. Weiss, Racheli Gordon-Soffer, Tal Naor, Reut Orange Kedem, Onit Alalouf, Tomer Michaeli, Yoav Shechtman

Research output: Contribution to journalConference articlepeer-review


In this talk I will describe how joint optimization of the microscope’s point-spread-function alongside the image processing algorithm, both using neural nets, enables dense emitter fitting for super-resolution microscopy and other challenging volumetric microscopy applications.

Original languageEnglish
JournalOptics InfoBase Conference Papers
StatePublished - 2021
Event3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2021 - Part of Imaging and Applied Optics Congress 2021 - Virtual, Online, United States
Duration: 19 Jul 202123 Jul 2021

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials


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