Thickness dependence of the resistivity tensor in epitaxial magnetite thin films

N. Naftalis; Y. Shperber; J. A. Moyer; C. H. Ahn; L. Klein

doi:10.1063/1.4816399

Thickness dependence of the resistivity tensor in epitaxial magnetite thin films

N. Naftalis, Y. Shperber, J. A. Moyer, C. H. Ahn, L. Klein

Department of Physics - at Bar-Ilan University

Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

Abstract

We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe₃O₄). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness.

Original language	English
Article number	043701
Journal	Journal of Applied Physics
Volume	114
Issue number	4
DOIs	https://doi.org/10.1063/1.4816399
State	Published - 28 Jul 2013

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.4816399

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title = "Thickness dependence of the resistivity tensor in epitaxial magnetite thin films",

abstract = "We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe3O4). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness.",

author = "N. Naftalis and Y. Shperber and Moyer, {J. A.} and Ahn, {C. H.} and L. Klein",

note = "Funding Information: L.K. acknowledges support by the Israel Science Foundation founded by the Israel Academy of Science and Humanities. Work at Yale supported by Grant No. NSF DMR 1119826 (CRISP). We acknowledge useful discussions with E. Shimshoni.",

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doi = "10.1063/1.4816399",

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AU - Naftalis, N.

AU - Shperber, Y.

AU - Moyer, J. A.

AU - Ahn, C. H.

AU - Klein, L.

N1 - Funding Information: L.K. acknowledges support by the Israel Science Foundation founded by the Israel Academy of Science and Humanities. Work at Yale supported by Grant No. NSF DMR 1119826 (CRISP). We acknowledge useful discussions with E. Shimshoni.

PY - 2013/7/28

Y1 - 2013/7/28

N2 - We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe3O4). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness.

AB - We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe3O4). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness.

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U2 - 10.1063/1.4816399

DO - 10.1063/1.4816399

M3 - مقالة

SN - 0021-8979

VL - 114

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 4

M1 - 043701

ER -

Thickness dependence of the resistivity tensor in epitaxial magnetite thin films

Abstract

All Science Journal Classification (ASJC) codes

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