The role of the cantilever in Kelvin probe force: Microscopy measurements

George Elias; Thilo Glatzel; Ernst Meyer; Alex Schwarzman; Amir Boag; Yossi Rosenwaks

doi:https://doi.org/10.3762/bjnano.2.29

The role of the cantilever in Kelvin probe force: Microscopy measurements

George Elias, Thilo Glatzel, Ernst Meyer, Alex Schwarzman, Amir Boag, Yossi Rosenwaks

School of Electrical Engineering

Tel Aviv University

Research output: Contribution to journal › Article › peer-review

Abstract

The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.

Original language	English
Pages (from-to)	252-260
Number of pages	9
Journal	Beilstein Journal of Nanotechnology
Volume	2
Issue number	1
DOIs	https://doi.org/10.3762/bjnano.2.29
State	Published - 2011

Keywords

Boundary elements method
Cantilever
Convolution
Kelvin probe force microscopy
Point spread function

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
General Materials Science
General Physics and Astronomy

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https://doi.org/10.3762/bjnano.2.29

Cite this

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abstract = "The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.",

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doi = "https://doi.org/10.3762/bjnano.2.29",

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AU - Elias, George

AU - Glatzel, Thilo

AU - Meyer, Ernst

AU - Schwarzman, Alex

AU - Boag, Amir

AU - Rosenwaks, Yossi

PY - 2011

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AB - The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.

KW - Boundary elements method

KW - Cantilever

KW - Convolution

KW - Kelvin probe force microscopy

KW - Point spread function

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JO - Beilstein Journal of Nanotechnology

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The role of the cantilever in Kelvin probe force: Microscopy measurements

Abstract

Keywords

All Science Journal Classification (ASJC) codes

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