The role of surface roughness in plasmonically assisted internal photoemission Schottky photodetectors

Meir Grajower, Uriel Levy, Jacob B. Khurgin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We describe the positive roll of roughness in enhancing the efficiency of internal photoemission. We show that roughness provides momentum relaxation enabling the transmission of energetic electrons through the Schottky barrier between metal and silicon.

Original languageAmerican English
Title of host publicationCLEO
Subtitle of host publicationQELS_Fundamental Science, CLEO_QELS 2018
DOIs
StatePublished - 2018
EventCLEO: QELS_Fundamental Science, CLEO_QELS 2018 - San Jose, United States
Duration: 13 May 201818 May 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F93-CLEO_QELS 2018

Conference

ConferenceCLEO: QELS_Fundamental Science, CLEO_QELS 2018
Country/TerritoryUnited States
CitySan Jose
Period13/05/1818/05/18

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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