The role of defects in solid state dewetting of ultrathin Ag film on Si(557)

A. N. Chaika, S. I. Bozhko, A. M. Ionov, I. Sveklo, E. Yu Postnova, V. N. Semenov, A. Bisht, Eugen Rabkin

Research output: Contribution to journalArticlepeer-review

Abstract

We have studied the solid state dewetting of ten monolayers thick Ag film deposited on periodically patterned Si(557) surface. The annealing of the system in the ultra-high vacuum at the temperatures between 300 and 400 °C resulted in full agglomeration of the film and formation of faceted single crystalline Ag nanoparticles exhibiting bimodal size distribution. We demonstrated that some particles contain screw dislocations producing a step on the upper particle facet. We related the bimodality in particles distribution with the ability of dislocation-containing Ag particles to evolve by Ostwald ripening mechanism.

Original languageEnglish
Article number113655
JournalScripta Materialia
Volume194
DOIs
StatePublished - 15 Mar 2021

Keywords

  • Dislocation
  • Scanning tunneling microscopy (STM)
  • Surface reconstruction
  • Surface structure
  • Thin films

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • General Materials Science

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