The Eventual C-Element Theorem for Delay-Insensitive Asynchronous Circuits

Rajit Manohar, Yoram Moses

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In a seminal 1990 paper [9], Martin presents the C-element Theorem which implies, roughly, that the class of purely delay insensitive (DI) circuits is fundamentally limited in the set of functions it can implement. We provide circuit examples, both DI and not DI, that violate assumptions or results from [9], showing that the set of circuits considered by [9] is more limited than one might expect - and hence, the results from [9] are weaker than previously thought. In this paper we address this issue and amend matters. We use a model of circuits that naturally captures DI properties, and in particular admits all of our circuit examples. We prove the Eventual C-element Theorem for DI circuits. This is a variant of the C-element Theorem that similarly implies that the class of DI circuits is very limited. The proof of the new theorem uses novel techniques, and in particular makes use of a combinatorial property not present in previous work. With the new result, Martins original insight and its profound implications are restored and provided with a new mathematical justification.

Original languageEnglish
Title of host publicationProceedings - 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems, ASYNC 2017
Pages102-109
Number of pages8
ISBN (Electronic)9781538627495
DOIs
StatePublished - 3 Nov 2017
Event23rd IEEE International Symposium on Asynchronous Circuits and Systems, ASYNC 2017 - San Diego, United States
Duration: 21 May 201724 May 2017

Publication series

NameProceedings - International Symposium on Asynchronous Circuits and Systems
Volume2017-May

Conference

Conference23rd IEEE International Symposium on Asynchronous Circuits and Systems, ASYNC 2017
Country/TerritoryUnited States
CitySan Diego
Period21/05/1724/05/17

Keywords

  • asynchronous circuits
  • delay insensitive circuits
  • potential causality

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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