Tessellation Structured Illumination Microscopy

Doron Shterman; Ori Eyal; Shai Tsesses; Guy Bartal

Tessellation Structured Illumination Microscopy

Doron Shterman, Ori Eyal, Shai Tsesses, Guy Bartal

Technion - Israel Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.

Original language	English
Title of host publication	2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
ISBN (Electronic)	9781943580767
State	Published - May 2020
Event	2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States Duration: 10 May 2020 → 15 May 2020

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2020-May

Conference

Conference	2020 Conference on Lasers and Electro-Optics, CLEO 2020
Country/Territory	United States
City	San Jose
Period	10/05/20 → 15/05/20

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

https://opg.optica.org/abstract.cfm?URI=CLEO_AT-2020-AM2I.3

Cite this

@inproceedings{2195ab69b2254a07b4885187657d4e00,

title = "Tessellation Structured Illumination Microscopy",

abstract = "Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.",

author = "Doron Shterman and Ori Eyal and Shai Tsesses and Guy Bartal",

note = "Publisher Copyright: {\textcopyright} 2020 OSA.; 2020 Conference on Lasers and Electro-Optics, CLEO 2020 ; Conference date: 10-05-2020 Through 15-05-2020",

year = "2020",

month = may,

language = "الإنجليزيّة",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

booktitle = "2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings",

}

Shterman, D, Eyal, O, Tsesses, S & Bartal, G 2020, Tessellation Structured Illumination Microscopy. in 2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings., 9193115, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, vol. 2020-May, 2020 Conference on Lasers and Electro-Optics, CLEO 2020, San Jose, United States, 10/05/20. <https://opg.optica.org/abstract.cfm?URI=CLEO_AT-2020-AM2I.3>

Tessellation Structured Illumination Microscopy. / Shterman, Doron; Eyal, Ori; Tsesses, Shai et al.
2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings. 2020. 9193115 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS; Vol. 2020-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Tessellation Structured Illumination Microscopy

AU - Shterman, Doron

AU - Eyal, Ori

AU - Tsesses, Shai

AU - Bartal, Guy

PY - 2020/5

Y1 - 2020/5

N2 - Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.

AB - Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.

UR - http://www.scopus.com/inward/record.url?scp=85091667118&partnerID=8YFLogxK

M3 - منشور من مؤتمر

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

BT - 2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings

T2 - 2020 Conference on Lasers and Electro-Optics, CLEO 2020

Y2 - 10 May 2020 through 15 May 2020

ER -

Tessellation Structured Illumination Microscopy

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

Access to Document

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Cite this