Temperature dependence of the local conductance in nanocrystalline CdSe films

D. Toker, I. Balberg, O. Zelaya-Angel, E. Savir, O. Millo

Research output: Contribution to journalArticlepeer-review

Abstract

We have studied the local transport properties of nanocrystalline CdSe films by conductance atomic force microscopy (C-AFM) in the temperature range of 25-300 K. Surprisingly, the conductance measured under positive AFM-tip bias for the more resistive films was found to increase with decreasing temperature (i.e., "metallic-like behavior"), whereas the opposite temperature dependence was observed for the more conductive samples consisting of larger crystallites. We explain the results by considering the crystallite-size dependence of quantum-confinement and electron delocalization, which accounts also for the current decay-rate under the application of negative tip-bias.

Original languageAmerican English
Article number012102
JournalApplied Physics Letters
Volume99
Issue number1
DOIs
StatePublished - 4 Jul 2011

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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