Super-resolved second harmonic generation imaging by coherent image scanning microscopy

Dekel Raanan; Man Suk Song; William A Tisdale; Dan Oron

doi:https://doi.org/10.1063/5.0073161

Super-resolved second harmonic generation imaging by coherent image scanning microscopy

Dekel Raanan, Man Suk Song, William A Tisdale, Dan Oron

Weizmann Institute of Science

Research output: Contribution to journal › Article › peer-review

Abstract

We extend image scanning microscopy to second harmonic generation (SHG) by extracting the complex field amplitude of the second-harmonic beam. While the theory behind coherent image scanning microscopy (ISM) is known, an experimental demonstration was not yet established. The main reason is that the naive intensity-reassignment procedure cannot be used for coherent scattering as the point spread function is now defined for the field amplitude rather than for the intensity. We use an inline interferometer to demonstrate super-resolved phase-sensitive SHG microscopy by applying the ISM reassignment machinery on the resolved field. This scheme can be easily extended to third harmonic generation and stimulated Raman microscopy schemes.

Original language	English
Article number	071111
Journal	Applied Physics Letters
Volume	120
Issue number	7
DOIs	https://doi.org/10.1063/5.0073161
State	Published - 14 Feb 2022

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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title = "Super-resolved second harmonic generation imaging by coherent image scanning microscopy",

abstract = "We extend image scanning microscopy to second harmonic generation (SHG) by extracting the complex field amplitude of the second-harmonic beam. While the theory behind coherent image scanning microscopy (ISM) is known, an experimental demonstration was not yet established. The main reason is that the naive intensity-reassignment procedure cannot be used for coherent scattering as the point spread function is now defined for the field amplitude rather than for the intensity. We use an inline interferometer to demonstrate super-resolved phase-sensitive SHG microscopy by applying the ISM reassignment machinery on the resolved field. This scheme can be easily extended to third harmonic generation and stimulated Raman microscopy schemes.",

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AB - We extend image scanning microscopy to second harmonic generation (SHG) by extracting the complex field amplitude of the second-harmonic beam. While the theory behind coherent image scanning microscopy (ISM) is known, an experimental demonstration was not yet established. The main reason is that the naive intensity-reassignment procedure cannot be used for coherent scattering as the point spread function is now defined for the field amplitude rather than for the intensity. We use an inline interferometer to demonstrate super-resolved phase-sensitive SHG microscopy by applying the ISM reassignment machinery on the resolved field. This scheme can be easily extended to third harmonic generation and stimulated Raman microscopy schemes.

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Super-resolved second harmonic generation imaging by coherent image scanning microscopy

Abstract

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