Abstract
Ultrasound localization microscopy has enabled super-resolution vascular imaging through precise localization of individual ultrasound contrast agents (microbubbles) across numerous imaging frames. However, analysis of high-density regions with significant overlaps among the microbubble point spread responses yields high localization errors, constraining the technique to low-concentration conditions. As such, long acquisition times are required to sufficiently cover the vascular bed. In this work, we present a fast and precise method for obtaining super-resolution vascular images from high-density contrast-enhanced ultrasound imaging data. This method, which we term Deep Ultrasound Localization Microscopy (Deep-ULM), exploits modern deep learning strategies and employs a convolutional neural network to perform localization microscopy in dense scenarios, learning the nonlinear image-domain implications of overlapping RF signals originating from such sets of closely spaced microbubbles. Deep-ULM is trained effectively using realistic on-line synthesized data, enabling robust inference in-vivo under a wide variety of imaging conditions. We show that deep learning attains super-resolution with challenging contrast-Agent densities, both in-silico as well as in-vivo. Deep-ULM is suitable for real-Time applications, resolving about 70 high-resolution patches ( 128\times 128 pixels) per second on a standard PC. Exploiting GPU computation, this number increases to 1250 patches per second.
| Original language | English |
|---|---|
| Article number | 9257449 |
| Pages (from-to) | 829-839 |
| Number of pages | 11 |
| Journal | IEEE transactions on medical imaging |
| Volume | 40 |
| Issue number | 3 |
| Early online date | 16 Nov 2020 |
| DOIs | |
| State | Published - Mar 2021 |
Keywords
- Ultrasound
- deep learning
- neural network
- super resolution
- ultrasound localization microscopy
All Science Journal Classification (ASJC) codes
- Software
- Radiological and Ultrasound Technology
- Computer Science Applications
- Electrical and Electronic Engineering
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