Sub-Pixel Tracking of sub-Wavelength Elements from Fourier Intensity Measurements

Yoav Shechtman, H. Dana, Shy Shoham, Yonina C. Eldar, Oren Cohen, Mordechai Segev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Frontiers in Optics/Laser Science XXVIII (FiO/LS) , 2012
State	Published - 2012
Externally published	Yes
Event	Frontiers in Optics / Laser Science XXVIII - Rochester, New York United States, Rochester, United States Duration: 14 Oct 2012 → 18 Oct 2012 Conference number: 28th

Conference	Frontiers in Optics / Laser Science XXVIII
Abbreviated title	FiO/LS 2012
Country/Territory	United States
City	Rochester
Period	14/10/12 → 18/10/12

Cite this

@inproceedings{bbd0444fcb144c9bace20da06a0b4ac5,

title = "Sub-Pixel Tracking of sub-Wavelength Elements from Fourier Intensity Measurements",

author = "Yoav Shechtman and H. Dana and Shy Shoham and Eldar, {Yonina C.} and Oren Cohen and Mordechai Segev",

year = "2012",

language = "الإنجليزيّة",

booktitle = "Frontiers in Optics/Laser Science XXVIII (FiO/LS) , 2012",

note = "Frontiers in Optics / Laser Science XXVIII ; Conference date: 14-10-2012 Through 18-10-2012",

}

TY - GEN

T1 - Sub-Pixel Tracking of sub-Wavelength Elements from Fourier Intensity Measurements

AU - Shechtman, Yoav

AU - Dana, H.

AU - Shoham, Shy

AU - Eldar, Yonina C.

AU - Cohen, Oren

AU - Segev, Mordechai

N1 - Conference code: 28th

PY - 2012

Y1 - 2012

M3 - منشور من مؤتمر

BT - Frontiers in Optics/Laser Science XXVIII (FiO/LS) , 2012

T2 - Frontiers in Optics / Laser Science XXVIII

Y2 - 14 October 2012 through 18 October 2012

ER -