Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

Department of Materials Science and Engineering

Research output: Book/Report › Book

Original language	English
Place of Publication	[Tel-Aviv]
Number of pages	118
State	Published - 2016

Keywords

Nanotechnology
Scanning tunneling microscopy
Semiconductors

Cite this

@book{a1b11210e28c4ecc9e7ff4e903788aff,

title = "Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy",

keywords = "Nanotechnology, Scanning tunneling microscopy, Semiconductors",

author = "{Cohen Taguri}, Gili and Ilan Goldfarb",

note = "Includes bibliographical references",

year = "2016",

language = "الإنجليزيّة",

}

TY - BOOK

T1 - Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

AU - Cohen Taguri, Gili

AU - Goldfarb, Ilan

N1 - Includes bibliographical references

PY - 2016

Y1 - 2016

KW - Nanotechnology

KW - Scanning tunneling microscopy

KW - Semiconductors

M3 - كتاب

BT - Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

CY - [Tel-Aviv]

ER -