Steep dispersion engineering and opto-atomic precision metrology XI: 29 January-1 February 2018, San Francisco, California, United States

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Name	Proceedings of SPIE
Volume	Volume 10548

Keywords

@inproceedings{96bcda905e3e4dd88aeec60289cdc8e4,

title = "Steep dispersion engineering and opto-atomic precision metrology XI: 29 January-1 February 2018, San Francisco, California, United States",

keywords = "Metrology",

author = "Shahriar, \{Selim M\} and Jacob Scheuer",

year = "2018",

language = "الإنجليزيّة",

isbn = "9781510615823",

series = "Proceedings of SPIE",

publisher = "SPIE",

booktitle = "Proceedings of SPIE",

address = "الولايات المتّحدة",

}

TY - GEN

T1 - Steep dispersion engineering and opto-atomic precision metrology XI

T2 - 29 January-1 February 2018, San Francisco, California, United States

AU - Shahriar, Selim M

AU - Scheuer, Jacob

PY - 2018

Y1 - 2018

KW - Metrology

M3 - منشور من مؤتمر

SN - 9781510615823

SN - 1510615822

T3 - Proceedings of SPIE

BT - Proceedings of SPIE

PB - SPIE

CY - Bellingham, Washington

ER -