@inproceedings{0476e09011104411b420c4a22d1dc018,
title = "STED like microscopy based on plasma dispersion effect in silicon",
abstract = "We present a new method for laser beam shaping, in silicon, based on plasma dispersion effect (PDE) and use it to overcome the diffraction resolution limit in silicon in approach similar to stimulated emission depletion (STED) scanning fluorescence microscopy.",
author = "Hadar Pinhas and Yossef Danan and Moshe Sinvani and Meir Danino and Zeev Zalevsky",
note = "Publisher Copyright: {\textcopyright} 2016 OSA.; Computational Optical Sensing and Imaging, COSI 2017 ; Conference date: 26-06-2017 Through 29-06-2017",
year = "2017",
doi = "10.1364/COSI.2017.CTh3B.5",
language = "الإنجليزيّة",
isbn = "9781943580293",
series = "Optics InfoBase Conference Papers",
publisher = "Optica Publishing Group (formerly OSA)",
booktitle = "Computational Optical Sensing and Imaging, COSI 2017",
}