Spectro-ellipsometric surface plasmon resonance sensor using a liquid crystal achromatic waveplate

Ibrahim Watad, Marwan J. Abuleil, Ibrahim Abdulhalim

Research output: Contribution to journalArticlepeer-review

Abstract

Wavelength dependence of phase modulators has been one of the main challenges in spectroscopic ellipsometry/polarimetry (EP) which significantly complicates signals analysis. A known approach to overcome this complication is using rotatable polarizers. However, the use of rotatable polarizers induces mechanical vibrations and unnecessary errors to the system. In this work, a novel spectroscopic configuration to extract the spectral changes of the EP parameters applied to surface plasmon resonance (SPR) sensing is presented. The setup utilizes the integration of a recently developed achromatic variable liquid crystal waveplate to the SPR in Kretschmann-Raether configuration and using three phase shifts to extract the EP parameters of the SPR sample.

Original languageEnglish
Article number9050495
Pages (from-to)550-553
Number of pages4
JournalIEEE Photonics Technology Letters
Volume32
Issue number9
DOIs
StatePublished - 1 May 2020

Keywords

  • Surface plasmon polaritons
  • optical sensors
  • spectroscopic ellipsometry
  • thin films

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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