Spectro-ellipsometric surface plasmon resonance sensor using a liquid crystal achromatic waveplate

Ibrahim Watad; Marwan J. Abuleil; Ibrahim Abdulhalim

doi:https://doi.org/10.1109/LPT.2020.2984015

Spectro-ellipsometric surface plasmon resonance sensor using a liquid crystal achromatic waveplate

Ibrahim Watad, Marwan J. Abuleil, Ibrahim Abdulhalim

Research output: Contribution to journal › Article › peer-review

Abstract

Wavelength dependence of phase modulators has been one of the main challenges in spectroscopic ellipsometry/polarimetry (EP) which significantly complicates signals analysis. A known approach to overcome this complication is using rotatable polarizers. However, the use of rotatable polarizers induces mechanical vibrations and unnecessary errors to the system. In this work, a novel spectroscopic configuration to extract the spectral changes of the EP parameters applied to surface plasmon resonance (SPR) sensing is presented. The setup utilizes the integration of a recently developed achromatic variable liquid crystal waveplate to the SPR in Kretschmann-Raether configuration and using three phase shifts to extract the EP parameters of the SPR sample.

Original language	American English
Article number	9050495
Pages (from-to)	550-553
Number of pages	4
Journal	IEEE Photonics Technology Letters
Volume	32
Issue number	9
DOIs	https://doi.org/10.1109/LPT.2020.2984015
State	Published - 1 May 2020

Keywords

Surface plasmon polaritons
optical sensors
spectroscopic ellipsometry
thin films

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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https://doi.org/10.1109/LPT.2020.2984015

Cite this

@article{f424c613324b424db0b3c000ab3be1c1,

title = "Spectro-ellipsometric surface plasmon resonance sensor using a liquid crystal achromatic waveplate",

abstract = "Wavelength dependence of phase modulators has been one of the main challenges in spectroscopic ellipsometry/polarimetry (EP) which significantly complicates signals analysis. A known approach to overcome this complication is using rotatable polarizers. However, the use of rotatable polarizers induces mechanical vibrations and unnecessary errors to the system. In this work, a novel spectroscopic configuration to extract the spectral changes of the EP parameters applied to surface plasmon resonance (SPR) sensing is presented. The setup utilizes the integration of a recently developed achromatic variable liquid crystal waveplate to the SPR in Kretschmann-Raether configuration and using three phase shifts to extract the EP parameters of the SPR sample.",

keywords = "Surface plasmon polaritons, optical sensors, spectroscopic ellipsometry, thin films",

author = "Ibrahim Watad and Abuleil, {Marwan J.} and Ibrahim Abdulhalim",

note = "Publisher Copyright: {\textcopyright} 1989-2012 IEEE.",

year = "2020",

month = may,

day = "1",

doi = "https://doi.org/10.1109/LPT.2020.2984015",

language = "American English",

volume = "32",

pages = "550--553",

number = "9",

}

TY - JOUR

T1 - Spectro-ellipsometric surface plasmon resonance sensor using a liquid crystal achromatic waveplate

AU - Watad, Ibrahim

AU - Abuleil, Marwan J.

AU - Abdulhalim, Ibrahim

PY - 2020/5/1

Y1 - 2020/5/1

N2 - Wavelength dependence of phase modulators has been one of the main challenges in spectroscopic ellipsometry/polarimetry (EP) which significantly complicates signals analysis. A known approach to overcome this complication is using rotatable polarizers. However, the use of rotatable polarizers induces mechanical vibrations and unnecessary errors to the system. In this work, a novel spectroscopic configuration to extract the spectral changes of the EP parameters applied to surface plasmon resonance (SPR) sensing is presented. The setup utilizes the integration of a recently developed achromatic variable liquid crystal waveplate to the SPR in Kretschmann-Raether configuration and using three phase shifts to extract the EP parameters of the SPR sample.

AB - Wavelength dependence of phase modulators has been one of the main challenges in spectroscopic ellipsometry/polarimetry (EP) which significantly complicates signals analysis. A known approach to overcome this complication is using rotatable polarizers. However, the use of rotatable polarizers induces mechanical vibrations and unnecessary errors to the system. In this work, a novel spectroscopic configuration to extract the spectral changes of the EP parameters applied to surface plasmon resonance (SPR) sensing is presented. The setup utilizes the integration of a recently developed achromatic variable liquid crystal waveplate to the SPR in Kretschmann-Raether configuration and using three phase shifts to extract the EP parameters of the SPR sample.

KW - Surface plasmon polaritons

KW - optical sensors

KW - spectroscopic ellipsometry

KW - thin films

UR - http://www.scopus.com/inward/record.url?scp=85084114779&partnerID=8YFLogxK

U2 - https://doi.org/10.1109/LPT.2020.2984015

DO - https://doi.org/10.1109/LPT.2020.2984015

M3 - Article

SN - 1041-1135

VL - 32

SP - 550

EP - 553

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 9

M1 - 9050495

ER -

Spectro-ellipsometric surface plasmon resonance sensor using a liquid crystal achromatic waveplate

Abstract

Keywords

All Science Journal Classification (ASJC) codes

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