Sparsity-based Ankylography: Recovering 3D structures from a single-shot 2D scattered intensity

Maor Mutzafi, Yoav Shechtman, Oren Cohen, Yonina C. Eldar C., Mordechai Segev

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present an algorithmic paradigm for deciphering the 3D structure of a molecule from the far-field intensity of scattered x-ray photons before the molecule disintegrates. Our approach enables surpassing current limits on recoverable information capacity.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS_Fundamental Science 2014
DOIs
StatePublished - 2014
Event2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States
Duration: 8 Jun 201413 Jun 2014

Publication series

NameConference on Lasers and Electro-Optics (CLEO)
ISSN (Print)2160-8989

Conference

Conference2014 Conference on Lasers and Electro-Optics, CLEO 2014
Country/TerritoryUnited States
CitySan Jose
Period8/06/1413/06/14

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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