SOFI for Plasmonics: Extracting Near-field Intensity in the Far-Field at High Density

R. C. Boutelle, X. Yi, D. Neuhauser, S. Weiss

Research output: Working paperPreprint

Abstract

Unlike normal fluorescent methods that use the intensity as a direct measurement of the localized enhanced field, we use blinking statistics of quantum dots (QDs). We have already shown that blinking gives a more accurate characterization of the near-field. When an emitter is situated close to a metallic surface, non-radiative pathways are opened up, leading to quenching of the exciton. Blinking statistics, however, is only minimally affected by quenching, and therefore can be used to probe emitters in close proximity to metallic surfaces. We have expanded our method (COFIBINS) to high densities using superresolution technique SOFI. A proof of principle for SOFI-COFIBINS is demonstrated with a defocused point spread function. The method is then applied to surface plasmon polaritons. SOFI-COFIBINS shows excellent agreement with the average fluorescence intensity.
Original languageEnglish
Number of pages7
Volume10552
StatePublished - 31 Oct 2017

Publication series

NamearXiv preprint arXiv:1710.,

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