@inproceedings{cd93d23f834844a5b68d579073d01d0e,
title = "Slow light, fast light, and opto-atomic precision metrology X: 30 January-2 February 2017, San Francisco, California, United States",
keywords = "Nonlinear optics, Quantum optics",
author = "Shahriar, {Selim M} and Jacob Scheuer",
note = "Includes bibliographical references",
year = "2017",
language = "الإنجليزيّة",
isbn = "1510606807",
series = "Proceedings of SPIE",
publisher = "SPIE",
booktitle = "Proceedings of SPIE",
address = "الولايات المتّحدة",
}