@inproceedings{28bdc60775c04241a8ac74d255fd1462,
title = "Slow light, fast light, and opto-atomic precision metrology VIII: 8-12 February 2015, San Francisco, California, United States",
keywords = "Lumi{\`e}re, Optique non lin{\'e}aire",
author = "Shahriar, {Selim M} and Jacob Scheuer",
note = "Comprend des r{\'e}f{\'e}rences bibliographiques",
year = "2015",
language = "الإنجليزيّة",
isbn = "9781628414684",
series = "Proceedings of SPIE",
publisher = "SPIE",
booktitle = "SPIE proceedings",
address = "الولايات المتّحدة",
}