Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX: 15-18 February 2016, San Francisco, California, United States

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Name	Proceedings of SPIE
Volume	volume 9763

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@inproceedings{9cc8d240460d4f988d7824b7e22a0091,

title = "Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX: 15-18 February 2016, San Francisco, California, United States",

author = "Shahriar, {Selim M} and Jacob Scheuer",

note = "Includes bibliographical references and author index",

year = "2016",

language = "الإنجليزيّة",

isbn = "1628419989",

series = "Proceedings of SPIE",

publisher = "SPIE",

booktitle = "Proceedings of SPIE",

address = "الولايات المتّحدة",

}

TY - GEN

T1 - Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX

T2 - 15-18 February 2016, San Francisco, California, United States

AU - Shahriar, Selim M

AU - Scheuer, Jacob

N1 - Includes bibliographical references and author index

PY - 2016

Y1 - 2016

M3 - منشور من مؤتمر

SN - 1628419989

SN - 9781628419986

T3 - Proceedings of SPIE

BT - Proceedings of SPIE

PB - SPIE

CY - Bellingham, Washington, USA

ER -