Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

S. Gorfman, H. Simons, T. Iamsasri, S. Prasertpalichat, D. P. Cann, H. Choe, U. Pietsch, Y. Watier, J. L. Jones

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics'. Together they form a unique fingerprint.

Physics & Astronomy