Abstract
This brief presents the unique capabilities of the multimode Dual Mode Logic (DML) design technique to define run-time adaptive datapaths to overcome process and environmental (i.e., temperature and voltage) variations. A proof-of-concept benchmark circuit is designed and fabricated in 65 nm technology. Measurements on 10 test chips, while considering supply voltages spanning 0.6V to 1.2V and temperature variations ranging from -40 °C to 125 °C confirm the effectiveness of this approach to compensate for severe process, voltage and temperature (PVT) variations.
| Original language | English |
|---|---|
| Article number | 9153856 |
| Pages (from-to) | 1639-1643 |
| Number of pages | 5 |
| Journal | IEEE Transactions on Circuits and Systems II: Express Briefs |
| Volume | 67 |
| Issue number | 9 |
| DOIs | |
| State | Published - 1 Sep 2020 |
Keywords
- Dual mode logic (DML)
- PVT variation tolerance
- adaptive circuits
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
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