Sensing with Memristive Complementary Resistive Switch: Modelling and Simulations

Vishal Gupta, Danilo Pellegrini, Saurabh Khandelwal, Abusaleh Jabir, Shahar Kvatinsky, Eugenio Martinelli, Corrado Di Natale, Marco Ottavi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Sensors give factual and process information about the environment or other physical phenomena. Sensing using memristors has been recently introduced for its potential for high density integration and miniaturization. Complementary Resistive Switch (CRS) based sensor provides an extremely efficient crossbar array that reduces the sneak current. The objective of this paper is to introduce and evaluate a circuit model for sensing using memristive complementary resistive switch. We introduce a reliable SPICE implementation of memristor model that captures the sensing behaviour of memristor. Our simulation results also validate the SPICE model for CRS sensing architecture, whose parameters could be easily adapted to match experimental data. The results also investigate the sensitivity and device behaviour of memristor and CRS sensor device in the presence of oxidizing and reducing gases of different concentration.

Original languageEnglish
Title of host publication33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020
EditorsLuigi Dilillo, Mihalis Psarakis, Taniya Siddiqua
ISBN (Electronic)9781728194578
DOIs
StatePublished - 19 Oct 2020
Event33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020 - Virtual, Online, Italy
Duration: 19 Oct 202021 Oct 2020

Publication series

Name33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020

Conference

Conference33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020
Country/TerritoryItaly
CityVirtual, Online
Period19/10/2021/10/20

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Signal Processing
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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