@inproceedings{d6633049f5674390940d53362d63cc80,
title = "Secured Dual-Rail-Precharge Mux-based (DPMUX) symmetric-logic for low voltage applications",
abstract = "Hardware implementations of cryptographic algorithms may leak information through numerous side channels, which can be used to reveal the secret cryptographic keys, and therefore compromise the security of the algorithm. Power Analysis Attacks (PAAs) [1] exploit the information leakage from the device's power consumption (typically measured on the supply and/or ground pins). Digital circuits consume dynamic switching energy when data propagate through the logic in each new calculation (e.g. new clock cycle). The average power dissipation of a design can be expressed by: Ptot(t) = α · (Pd(t) + Ppvt(t)) (1) where α is the activity factor (the probability that the gate will switch) and depends on the probability distribution of the inputs to the combinatorial logic. This induces a linear relationship between the power and the processed data [2]. Pd is the deterministic power dissipated by the switching of the gate, including any parasitic and intrinsic capacitances, and hence can be evaluated prior to manufacturing. Ppvt is the change in expected power consumption due to nondeterministic parameters such as process variations, mismatch, temperature, etc. In this manuscript, we describe the design of logic gates that induce data-independent (constant) α and Pd.",
author = "Zabib, {David Zooker} and Itamar Levi and Alexander Fish and Osnat Keren",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017 ; Conference date: 16-10-2017 Through 18-10-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/s3s.2017.8309254",
language = "الإنجليزيّة",
series = "2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--2",
booktitle = "2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017",
address = "الولايات المتّحدة",
}