Scanning SQUID measurements of oxide interfaces

Y. Frenkel, B. Kalisky

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

Abstract The chapter begins with a short description of the superconducting quantum interference device (SQUID) sensor and the scanning SQUID technique. Next, an introduction to scanning SQUID experiments on oxide interface in chronological order. In the introduction, we briefly describe each experiment and its conclusions and try to link between the different works. In the main body of the chapter, we go into more details of the different experiments and their conclusions. We aim to describe each experiment and link between the various conclusions.
Original languageEnglish
Title of host publicationMetal Oxide-Based Thin Film Structures
Subtitle of host publicationFormation, Characterization and Application of Interface-Based Phenomena Metal Oxides
EditorsNini Pryds, Vincenzo Esposito
Chapter10
Pages225-242
Number of pages18
Edition1st
ISBN (Electronic)9780081017524
DOIs
StatePublished - 7 Sep 2017

Publication series

NameMetal Oxide-Based Thin Film Structures 1st Edition

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