Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

Sascha Sadewasser; Iris Visoly-Fisher

doi:10.1002/9783527636280.ch11

Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

Sascha Sadewasser, Iris Visoly-Fisher

Department of Chemistry

Ben-Gurion University of the Negev

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	American English
Title of host publication	Advanced Characterization Techniques for Thin Film Solar Cells
Editors	Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau
Pages	275-298
Number of pages	24
DOIs	https://doi.org/10.1002/9783527636280.ch11
State	Published - 7 Apr 2011

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Atomic force microscopy (AFM)
Kelvin probe force microscope (KPFM)
Phase-locked loop (PLL)
Scanning capacitance microscopy (SCM)
Scanning spreading resistance microscopy (SSRM)
Tip-sample interaction

All Science Journal Classification (ASJC) codes

General Materials Science

Access to Document

10.1002/9783527636280.ch11

Cite this

@inbook{8746e088b8a14b32a82beafc493f0ca8,

title = "Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells",

keywords = "Atomic force microscopy (AFM), Kelvin probe force microscope (KPFM), Phase-locked loop (PLL), Scanning capacitance microscopy (SCM), Scanning spreading resistance microscopy (SSRM), Tip-sample interaction",

author = "Sascha Sadewasser and Iris Visoly-Fisher",

year = "2011",

month = apr,

day = "7",

doi = "10.1002/9783527636280.ch11",

language = "American English",

isbn = "9783527410033",

pages = "275--298",

editor = "Daniel Abou-Ras and Thomas Kirchartz and Uwe Rau",

booktitle = "Advanced Characterization Techniques for Thin Film Solar Cells",

}

TY - CHAP

T1 - Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

AU - Sadewasser, Sascha

AU - Visoly-Fisher, Iris

PY - 2011/4/7

Y1 - 2011/4/7

KW - Atomic force microscopy (AFM)

KW - Kelvin probe force microscope (KPFM)

KW - Phase-locked loop (PLL)

KW - Scanning capacitance microscopy (SCM)

KW - Scanning spreading resistance microscopy (SSRM)

KW - Tip-sample interaction

UR - http://www.scopus.com/inward/record.url?scp=84882714841&partnerID=8YFLogxK

U2 - 10.1002/9783527636280.ch11

DO - 10.1002/9783527636280.ch11

M3 - Chapter

SN - 9783527410033

SP - 275

EP - 298

BT - Advanced Characterization Techniques for Thin Film Solar Cells

A2 - Abou-Ras, Daniel

A2 - Kirchartz, Thomas

A2 - Rau, Uwe

ER -

Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

UN SDGs

Keywords

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this