@inproceedings{5cbb964b5120484bb6a78791f9f42b7a,
title = "S-SNOM Imaging of Stacking Order in Few-Layer Graphene",
abstract = "Stacked 2D layers of materials exhibit unique electronic, optical, and magnetic properties. Changes in the stacking order of these materials can create different phases with novel properties. Tetralayer graphene has three possible stacking phases, where two of them were experimentally observed: the Bernal (ABAB) and Rhombohedral (ABCD)[1-3], while the elusive third ABCB/ABAC has proven much harder to detect (Figure 1-A). In this work, we show that single wavelength (0.63 eV) Scattering Scanning Near-field Optical Microscopy (S-SNOM), in combination with an Oscillating Spherical Dipole (OSD) model, can be used to clearly image and categorize all three phases of tetralayer graphene.",
author = "Daniel Beitner and Shaked Amitay and Atri, {Simon Sallah} and Shachar Richter and Haim Suchowski and Shalom, {Moshe Ben}",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023 ; Conference date: 26-06-2023 Through 30-06-2023",
year = "2023",
doi = "https://doi.org/10.1109/CLEO/EUROPE-EQEC57999.2023.10231676",
language = "الإنجليزيّة",
series = "2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2023 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2023",
address = "الولايات المتّحدة",
}