Resolving bulk and grain boundary transport properties of TiO 2 thin films enabled by laser-induced anisotropic morphology

Guy Ankonina; Ui Jin Chung; Adrian M. Chitu; Yigal Komem; Avner Rothschild

doi:10.1002/adma.201100917

Resolving bulk and grain boundary transport properties of TiO ₂ thin films enabled by laser-induced anisotropic morphology

Guy Ankonina, Ui Jin Chung, Adrian M. Chitu, Yigal Komem, Avner Rothschild

Technion - Israel Institute of Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Precise deconvolution of grain and grain boundary contributions to the overall impedance of TiO ₂ thin films is achieved by impedance spectroscopy measurements of textured films with elongated grains obtained by laser-induced melting and sequential lateral solidification. The ability to engineer the grain morphology of electroceramic films provides opportunities for new designs of ferroelectric memories, piezoelectric microsensors and microactuators, optical waveguides, and other devices.

Original language	English
Pages (from-to)	3266-3271
Number of pages	6
Journal	Advanced Materials
Volume	23
Issue number	29
DOIs	https://doi.org/10.1002/adma.201100917
State	Published - 2 Aug 2011

Keywords

Thin films
TiO
grain boundaries
impedance spectroscopy
laser processing

All Science Journal Classification (ASJC) codes

Mechanics of Materials
Mechanical Engineering
General Materials Science

Access to Document

10.1002/adma.201100917

Cite this

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abstract = "Precise deconvolution of grain and grain boundary contributions to the overall impedance of TiO 2 thin films is achieved by impedance spectroscopy measurements of textured films with elongated grains obtained by laser-induced melting and sequential lateral solidification. The ability to engineer the grain morphology of electroceramic films provides opportunities for new designs of ferroelectric memories, piezoelectric microsensors and microactuators, optical waveguides, and other devices.",

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