Skip to main navigation Skip to search Skip to main content

Quantum interferometry with x-rays

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We demonstrate the pioneering use of a quantum interferometer with x-rays, highlighting its effectiveness in precisely measuring the phase accumulated in opaque media. Our work uncovers novel opportunities for measuring sub-Angstrom optical-path differences.

Original languageEnglish
Title of host publication2024 Conference on Lasers and Electro-Optics, CLEO 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171395
DOIs
StatePublished - May 2024
Event2024 Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 7 May 2024 → 10 May 2024

Publication series

Name2024 Conference on Lasers and Electro-Optics, CLEO 2024

Conference

Conference2024 Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period7/05/24 → 10/05/24

Keywords

  • Electro-optic effects
  • Media
  • Optical interferometry
  • Optical variables measurement
  • Phase measurement
  • X-ray lasers
  • X-rays

ASJC Scopus subject areas

  • Process Chemistry and Technology
  • Computer Networks and Communications
  • Civil and Structural Engineering
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fingerprint

Dive into the research topics of 'Quantum interferometry with x-rays'. Together they form a unique fingerprint.

Cite this