Quantum interferometry with x-rays

Y. Klein, E. Strizhevsky, H. Aknin, M. Deutsch, E. Cohen, A. Peer, K. Tamasaku, T. Schulli, E. Karimi, S. Shwartz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate the pioneering use of a quantum interferometer with x-rays, highlighting its effectiveness in precisely measuring the phase accumulated in opaque media. Our work uncovers novel opportunities for measuring sub-Angstrom optical-path differences.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationFundamental Science, CLEO:FS 2024 in Proceedings CLEO 2024 - Part of Conference on Lasers and Electro-Optics
ISBN (Electronic)9781957171395
DOIs
StatePublished - May 2024
EventCLEO: Fundamental Science, CLEO:FS 2024 - Part of Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 5 May 202410 May 2024

Publication series

NameCLEO: Fundamental Science, CLEO:FS 2024 in Proceedings CLEO 2024 - Part of Conference on Lasers and Electro-Optics

Conference

ConferenceCLEO: Fundamental Science, CLEO:FS 2024 - Part of Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period5/05/2410/05/24

All Science Journal Classification (ASJC) codes

  • Space and Planetary Science
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • General Computer Science
  • Atomic and Molecular Physics, and Optics

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