Quantum-Enhanced Microscopy Using Electron Number Pulses

Ethan Nussinson, Shiran Even-Haim, Rotem Elimelech, Ron Ruimy, Yonatan Israel, Ido Kaminer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose a quantum phase estimation protocol in electron microscopy and holography, breaking the shot-noise limit despite the intrinsic Poisson-statistics of electron sources. This surprising capability is enabled by nondestructive measurements heralding number-state electron pulses.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationFundamental Science, CLEO:FS 2024 in Proceedings CLEO 2024 - Part of Conference on Lasers and Electro-Optics
ISBN (Electronic)9781957171395
StatePublished - 2024
EventCLEO: Fundamental Science, CLEO:FS 2024 - Part of Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 5 May 202410 May 2024

Publication series

NameCLEO: Fundamental Science, CLEO:FS 2024 in Proceedings CLEO 2024 - Part of Conference on Lasers and Electro-Optics

Conference

ConferenceCLEO: Fundamental Science, CLEO:FS 2024 - Part of Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period5/05/2410/05/24

All Science Journal Classification (ASJC) codes

  • Space and Planetary Science
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • General Computer Science
  • Atomic and Molecular Physics, and Optics

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