Quadrature optical interferometry based in-plane displacement measurement of a MEMS grating

Manuel J.L.F. Rodrigues, Inês S. Garcia, Zeev Zalevsky, Rosana A. Dias, Filipe S. Alves, Diogo E. Aguiam

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, we devise an optical interferometry setup to directly measure the in-plane displacement of a microelectromechanical systems (MEMS) optical shutter modulator by using the first diffraction order generated by a grating on its surface. We employ optical homodyne detection and a derivation of a Mach-Zehnder interferometer with a polarization-based quadrature detection architecture to demonstrate nanometric in-plane transient displacement sensitivity at >200 kHz. We present a quadrature grating interferometry method to measure in-plane transient displacement of high-frequency MEMS actuators using a normal incident beam, opening the way for future multi-axis displacement sensing.

Original languageEnglish
Title of host publicationPhotonic Instrumentation Engineering XII
EditorsLynda E. Busse, Yakov Soskind
PublisherSPIE
ISBN (Electronic)9781510684942
DOIs
StatePublished - 2025
EventPhotonic Instrumentation Engineering XII 2025 - San Francisco, United States
Duration: 27 Jan 202530 Jan 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13373

Conference

ConferencePhotonic Instrumentation Engineering XII 2025
Country/TerritoryUnited States
CitySan Francisco
Period27/01/2530/01/25

Keywords

  • Quadrature interferometry
  • homodyne detection
  • in-plane displacement

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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