Pyroelectric measurement of surface layer: The case of thin film on dielectric substrate

D. Ehre; E. Mirzadeh; O. Stafsudd; I. Lubomirsky

doi:https://doi.org/10.1080/00150193.2014.964125

Pyroelectric measurement of surface layer: The case of thin film on dielectric substrate

D. Ehre, E. Mirzadeh, O. Stafsudd, I. Lubomirsky

Department of Molecular Chemistry and Materials Science Perlman

Weizmann Institute of Science

Research output: Contribution to journal › Article › peer-review

Abstract

We propose an extension of the periodic temperature change (Chynoweth) technique for the measurement of pyroelectric coefficient in the case of a pyroelectric thin film on an insulating (non-conductive) substrate. The modified technique adequately determines the pyroelectric coefficient of the film if its thickness is known. The method determines the pyroelectric coefficient of the substrate even if it is much smaller than that of the film. The method overestimates the thickness of the pyroelectric film and can be used as an estimate only. If the thickness of the pyroelectric film is not known, the method gives a product of the pyroelectric coefficient of the film and its thickness.

Original language	English
Pages (from-to)	41-49
Number of pages	9
Journal	Ferroelectrics
Volume	472
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2014.964125
State	Published - 1 Jan 2014

Keywords

Pyroelectric effect
surface pyroelectricity
thin films

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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https://doi.org/10.1080/00150193.2014.964125

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abstract = "We propose an extension of the periodic temperature change (Chynoweth) technique for the measurement of pyroelectric coefficient in the case of a pyroelectric thin film on an insulating (non-conductive) substrate. The modified technique adequately determines the pyroelectric coefficient of the film if its thickness is known. The method determines the pyroelectric coefficient of the substrate even if it is much smaller than that of the film. The method overestimates the thickness of the pyroelectric film and can be used as an estimate only. If the thickness of the pyroelectric film is not known, the method gives a product of the pyroelectric coefficient of the film and its thickness.",

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T2 - The case of thin film on dielectric substrate

AU - Ehre, D.

AU - Mirzadeh, E.

AU - Stafsudd, O.

AU - Lubomirsky, I.

PY - 2014/1/1

Y1 - 2014/1/1

N2 - We propose an extension of the periodic temperature change (Chynoweth) technique for the measurement of pyroelectric coefficient in the case of a pyroelectric thin film on an insulating (non-conductive) substrate. The modified technique adequately determines the pyroelectric coefficient of the film if its thickness is known. The method determines the pyroelectric coefficient of the substrate even if it is much smaller than that of the film. The method overestimates the thickness of the pyroelectric film and can be used as an estimate only. If the thickness of the pyroelectric film is not known, the method gives a product of the pyroelectric coefficient of the film and its thickness.

AB - We propose an extension of the periodic temperature change (Chynoweth) technique for the measurement of pyroelectric coefficient in the case of a pyroelectric thin film on an insulating (non-conductive) substrate. The modified technique adequately determines the pyroelectric coefficient of the film if its thickness is known. The method determines the pyroelectric coefficient of the substrate even if it is much smaller than that of the film. The method overestimates the thickness of the pyroelectric film and can be used as an estimate only. If the thickness of the pyroelectric film is not known, the method gives a product of the pyroelectric coefficient of the film and its thickness.

KW - Pyroelectric effect

KW - surface pyroelectricity

KW - thin films

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DO - https://doi.org/10.1080/00150193.2014.964125

M3 - مقالة

SN - 0015-0193

VL - 472

SP - 41

EP - 49

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Pyroelectric measurement of surface layer: The case of thin film on dielectric substrate

Abstract

Keywords

All Science Journal Classification (ASJC) codes

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