Proof of negative refraction: Beyond reasonable doubt?

Sherman W. Marcus, Ariel Epstein

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The past two decades have witnessed a flurry of designs of material with a negative index of refraction. These designs have been verified by experimentally observing the refraction direction through a prism-shaped form of the material, and by numerically computing the phase velocity within the material. The possibility is demonstrated herein that - for the particular manner in which these verifications are performed - it is possible to obtain negatively refracted waves and the appearance of negative phase velocity even using 'standard' homogeneous materials with a positive index of refraction. These possibilities stem (a) from Floquet-Bloch modes that are excited because of the periodic shape of the prism hypotenuse, and (b) from particular locations at which the phase is sampled. As a result, additional empirical evidence is required to unambiguously prove material negativity.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017
Pages1-4
Number of pages4
ISBN (Electronic)9781538631690
DOIs
StatePublished - 28 Jun 2017
Event2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017 - Tel-Aviv, Israel
Duration: 13 Nov 201715 Nov 2017

Publication series

Name2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017
Volume2017-November

Conference

Conference2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017
Country/TerritoryIsrael
CityTel-Aviv
Period13/11/1715/11/17

Keywords

  • Metamaterials
  • Negative refraction
  • Phase velocity

All Science Journal Classification (ASJC) codes

  • Radiation
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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