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Probing nanoscale optical fields and phase-shaping electron beams by inelastic electron-light scattering

  • Armin Feist
  • , Thomas Rittmann
  • , Tyler Harvey
  • , Katharina E. Priebe
  • , Christopher Rathje
  • , Ofer Kfir
  • , Jan Wilke Henke
  • , Sergey V. Yalunin
  • , Sascha Schäfer
  • , Claus Ropers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Ultrafast transmission electron microscopy (UTEM) is a powerful tool to study the dynamics of nanoscale systems, combining the versatile imaging, diffraction and spectroscopy capabilities of state-of-the-art TEM with femtosecond temporal resolution of a laser pump/electron probe scheme [1,2]. In particular, inelastic scattering between a free electron pulse and strong optical near fields [3,4] (Fig.1a) allows for a coherent manipulation of the electron quantum state. In this mechanism, the optical field imprints a sinusoidal phase modulation on the electron wave function [4], which manifests in a comb of photon sidebands in the kinetic energy distribution (Fig.1b) and - by energy-filtering - enables photon-induced near-field electron microscopy (PINEM) [3].

Original languageEnglish GB
Title of host publication2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728104690
DOIs
StatePublished - Jun 2019
Externally publishedYes
Event2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 - Munich, Germany
Duration: 23 Jun 2019 → 27 Jun 2019

Publication series

Name2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

Conference

Conference2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
Country/TerritoryGermany
CityMunich
Period23/06/19 → 27/06/19

ASJC Scopus subject areas

  • Spectroscopy
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications

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