@inproceedings{624bc54e3d15438f8c3c97b3d6729f1b,
title = "Probing nanoscale optical fields and phase-shaping electron beams by inelastic electron-light scattering",
abstract = "Ultrafast transmission electron microscopy (UTEM) is a powerful tool to study the dynamics of nanoscale systems, combining the versatile imaging, diffraction and spectroscopy capabilities of state-of-the-art TEM with femtosecond temporal resolution of a laser pump/electron probe scheme [1,2]. In particular, inelastic scattering between a free electron pulse and strong optical near fields [3,4] (Fig.1a) allows for a coherent manipulation of the electron quantum state. In this mechanism, the optical field imprints a sinusoidal phase modulation on the electron wave function [4], which manifests in a comb of photon sidebands in the kinetic energy distribution (Fig.1b) and - by energy-filtering - enables photon-induced near-field electron microscopy (PINEM) [3].",
author = "Armin Feist and Thomas Rittmann and Tyler Harvey and Priebe, {Katharina E.} and Christopher Rathje and Ofer Kfir and Henke, {Jan Wilke} and Yalunin, {Sergey V.} and Sascha Sch{\"a}fer and Claus Ropers",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 ; Conference date: 23-06-2019 Through 27-06-2019",
year = "2019",
month = jun,
doi = "https://doi.org/10.1109/CLEOE-EQEC.2019.8872437",
language = "الإنجليزيّة",
series = "2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019",
address = "الولايات المتّحدة",
}