Plasmonics in atomically thin crystalline silver

Vahagn Mkhitaryan, Zakaria M. Abd El-Fattah, J. Brede, L. Fernández, Qiushi Guo, Cheng Li, Arnab Ghosh, Doron Naveh, Fengnian Xia, J. E. Ortega, F. Javier García De Abajo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report on the fabrication of few-atomic-layer-thick wafer-scale crystalline silver films, along with the observation of plasmons in the near-to-mid infrared spectral regions upon lithographic structuring. Our measured optical spectra reveal narrow plasmons (quality factor ∼ 4), further supported by a low sheet resistance comparable to bulk metal in few-atomic-layer silver films down to 7 Ag(111) monolayers. Good crystal quality and plasmon narrowness are obtained despite the addition of a thin passivating dielectric, which renders our samples resilient to ambient conditions.

Original languageEnglish
Title of host publication21st International Conference on Transparent Optical Networks, ICTON 2019
PublisherIEEE Computer Society
ISBN (Electronic)9781728127798
DOIs
StatePublished - Jul 2019
Event21st International Conference on Transparent Optical Networks, ICTON 2019 - Angers, France
Duration: 9 Jul 201913 Jul 2019

Publication series

NameInternational Conference on Transparent Optical Networks
Volume2019-July

Conference

Conference21st International Conference on Transparent Optical Networks, ICTON 2019
Country/TerritoryFrance
CityAngers
Period9/07/1913/07/19

Keywords

  • 2D materials
  • 2D plasmonics
  • Atomically thin silver
  • Crystalline metal films
  • Ultrathin plasmonics

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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