Photon-induced far-field and near-field electron microscopy

Kangpeng Wang; Giovanni Maria Vanacore; Enrico Pomarico; Ivan Madan; Gabriele Berruto; Francisco Javier Garci´a de Abajo; Ido Kaminer; Fabrizio Carbone

doi:10.1364/CLEO_SI.2018.STh1N.4

Photon-induced far-field and near-field electron microscopy

Kangpeng Wang, Giovanni Maria Vanacore, Enrico Pomarico, Ivan Madan, Gabriele Berruto, Francisco Javier Garci´a de Abajo, Ido Kaminer, Fabrizio Carbone

Technion - Israel Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Science and Innovations, CLEO_SI 2018
DOIs	https://doi.org/10.1364/CLEO_SI.2018.STh1N.4
State	Published - 2018
Event	CLEO: Science and Innovations, CLEO_SI 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F94-CLEO_SI 2018

Conference

Conference	CLEO: Science and Innovations, CLEO_SI 2018
Country/Territory	United States
City	San Jose
Period	13/05/18 → 18/05/18

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Mechanics of Materials

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10.1364/CLEO_SI.2018.STh1N.4

Cite this

@inproceedings{d33514f7d90d45b3bbd21c3f2f943445,

title = "Photon-induced far-field and near-field electron microscopy",

abstract = "We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.",

author = "Kangpeng Wang and Vanacore, \{Giovanni Maria\} and Enrico Pomarico and Ivan Madan and Gabriele Berruto and \{de Abajo\}, \{Francisco Javier Garci´a\} and Ido Kaminer and Fabrizio Carbone",

note = "Publisher Copyright: {\textcopyright} OSA 2018.; CLEO: Science and Innovations, CLEO\_SI 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

doi = "10.1364/CLEO\_SI.2018.STh1N.4",

language = "الإنجليزيّة",

isbn = "9781943580422",

series = "Optics InfoBase Conference Papers",

booktitle = "CLEO",

}

Wang, K, Vanacore, GM, Pomarico, E, Madan, I, Berruto, G, de Abajo, FJG, Kaminer, I & Carbone, F 2018, Photon-induced far-field and near-field electron microscopy. in CLEO: Science and Innovations, CLEO_SI 2018. Optics InfoBase Conference Papers, vol. Part F94-CLEO_SI 2018, CLEO: Science and Innovations, CLEO_SI 2018, San Jose, United States, 13/05/18. https://doi.org/10.1364/CLEO_SI.2018.STh1N.4

TY - GEN

T1 - Photon-induced far-field and near-field electron microscopy

AU - Wang, Kangpeng

AU - Vanacore, Giovanni Maria

AU - Pomarico, Enrico

AU - Madan, Ivan

AU - Berruto, Gabriele

AU - de Abajo, Francisco Javier Garci´a

AU - Kaminer, Ido

AU - Carbone, Fabrizio

PY - 2018

Y1 - 2018

N2 - We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

AB - We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

UR - http://www.scopus.com/inward/record.url?scp=85048955758&partnerID=8YFLogxK

U2 - 10.1364/CLEO_SI.2018.STh1N.4

DO - 10.1364/CLEO_SI.2018.STh1N.4

M3 - منشور من مؤتمر

SN - 9781943580422

T3 - Optics InfoBase Conference Papers

BT - CLEO

T2 - CLEO: Science and Innovations, CLEO_SI 2018

Y2 - 13 May 2018 through 18 May 2018

ER -

Photon-induced far-field and near-field electron microscopy

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

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