Photon-Induced Far-Field and Near-Field Electron Microscopy

Kangpeng Wang; Giovanni Maria Vanacore; Enrico Pomarico; Ivan Madan; Gabriele Berruto; Francisco Javier Garcia De Abajo; Ido Kaminer; Fabrizio Carbone

Photon-Induced Far-Field and Near-Field Electron Microscopy

Kangpeng Wang, Giovanni Maria Vanacore, Enrico Pomarico, Ivan Madan, Gabriele Berruto, Francisco Javier Garcia De Abajo, Ido Kaminer, Fabrizio Carbone

Technion - Israel Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
State	Published - 6 Aug 2018
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	13/05/18 → 18/05/18

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

@inproceedings{d3cbec5f60894bd39f7872f15228618e,

title = "Photon-Induced Far-Field and Near-Field Electron Microscopy",

abstract = "We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.",

author = "Kangpeng Wang and Vanacore, {Giovanni Maria} and Enrico Pomarico and Ivan Madan and Gabriele Berruto and {De Abajo}, {Francisco Javier Garcia} and Ido Kaminer and Fabrizio Carbone",

note = "Publisher Copyright: {\textcopyright} 2018 OSA.; 2018 Conference on Lasers and Electro-Optics, CLEO 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

month = aug,

day = "6",

language = "الإنجليزيّة",

isbn = "9781943580422",

series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

}

Wang, K, Vanacore, GM, Pomarico, E, Madan, I, Berruto, G, De Abajo, FJG, Kaminer, I & Carbone, F 2018, Photon-Induced Far-Field and Near-Field Electron Microscopy. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8427814, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 13/05/18.

Photon-Induced Far-Field and Near-Field Electron Microscopy. / Wang, Kangpeng; Vanacore, Giovanni Maria; Pomarico, Enrico et al.
2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. 2018. 8427814 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Photon-Induced Far-Field and Near-Field Electron Microscopy

AU - Wang, Kangpeng

AU - Vanacore, Giovanni Maria

AU - Pomarico, Enrico

AU - Madan, Ivan

AU - Berruto, Gabriele

AU - De Abajo, Francisco Javier Garcia

AU - Kaminer, Ido

AU - Carbone, Fabrizio

PY - 2018/8/6

Y1 - 2018/8/6

N2 - We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

AB - We present developments in the technique of photo-induced near-field electron microscopy. (PINEM) We image the electron interaction with a far-field plane wave reflected from a mirror, and with the near-field resonance of a plasmonic nanowire.

UR - http://www.scopus.com/inward/record.url?scp=85052608001&partnerID=8YFLogxK

M3 - منشور من مؤتمر

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

T2 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018

Y2 - 13 May 2018 through 18 May 2018

ER -

Photon-Induced Far-Field and Near-Field Electron Microscopy

Abstract

Publication series

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All Science Journal Classification (ASJC) codes

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