@inproceedings{3d88cc1d171b4dd99d23fe7d2c4a21d4,
title = "Phase extraction in microscopy using tunable defocusing by means of a SLM",
abstract = "In many practical microscopy applications the use of phase information is crucial. In this contribution we propose a method for phase extraction in a microscopy system based on analysis of images with varying defocusing. The system has no mobile parts owing to the defocusing by means of a spatial light modulator. The base of the method is the captre of images in a microscope with varying tube lens focal lengths. This produce a set of intensity images, all of them related, because the can be generated by free space propagation of a complex distribution which is unknown.",
keywords = "Microscopy, Phase extraction, Spatial light modulator, Wavefront reconstruction",
author = "Luis Camacho and Vicente Mic{\'o} and Zeev Zalevsky and Javier Garc{\'i}a",
year = "2011",
doi = "https://doi.org/10.1117/12.889591",
language = "الإنجليزيّة",
isbn = "9780819486783",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Optical Measurement Systems for Industrial Inspection VII",
note = "Optical Measurement Systems for Industrial Inspection VII ; Conference date: 23-05-2011 Through 26-05-2011",
}