TY - GEN
T1 - PESEC - A Simple Power-Efficient Single Error Correcting Coding Scheme for RRAM
AU - Engelberg, Shlomo
AU - Keren, Osnat
N1 - Publisher Copyright: © 2025 EDAA.
PY - 2025
Y1 - 2025
N2 - The power consumed when writing to Resistive Random Access Memory (RRAM) is significantly greater than that consumed by many charge-based memories such as SRAM, DRAM and NAND-Flash memories. As a result, when used in applications where instantaneous power consumption is constrained, the number of bits that can be set or reset must not exceed a certain threshold. In this paper, we present a power-efficient, single error correcting (PESEC) code for memory macros, which, when combined with bus encoding, ensures low-power operation and reliable data storage. This systematic, multiple-representation based single-error correcting code provides a relatively high rate, with a marginal increase in implementation cost relative to that of a standard Hamming code, and it can be used with any bus encoder.
AB - The power consumed when writing to Resistive Random Access Memory (RRAM) is significantly greater than that consumed by many charge-based memories such as SRAM, DRAM and NAND-Flash memories. As a result, when used in applications where instantaneous power consumption is constrained, the number of bits that can be set or reset must not exceed a certain threshold. In this paper, we present a power-efficient, single error correcting (PESEC) code for memory macros, which, when combined with bus encoding, ensures low-power operation and reliable data storage. This systematic, multiple-representation based single-error correcting code provides a relatively high rate, with a marginal increase in implementation cost relative to that of a standard Hamming code, and it can be used with any bus encoder.
KW - Bus encoding
KW - Emerging non-volatile memory
KW - Power-efficient coding
KW - Resistive RAM (RRAM)
KW - Single error correction (SEC)
KW - Write after Read
UR - http://www.scopus.com/inward/record.url?scp=105006904574&partnerID=8YFLogxK
U2 - 10.23919/date64628.2025.10993067
DO - 10.23919/date64628.2025.10993067
M3 - منشور من مؤتمر
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 Design, Automation and Test in Europe Conference, DATE 2025
Y2 - 31 March 2025 through 2 April 2025
ER -