Performance assessment and RUL prediction of power converters under the multiple components degradation

Akanksha Chaturvedi, Monalisa Sarma, Sanjay K. Chaturvedi, Joseph Bernstein

Research output: Contribution to journalArticlepeer-review

Abstract

DC-DC power converters are ubiquitously employed to produce an efficiently regulated voltage to a load that may be either constant or varying, from a source that may or may not be well controlled. DC-DC converters are power conversion circuits that use high-frequency switches and inductors, transformers, and capacitors to filter switching noise into regulated DC voltages. It is necessary to estimate the remaining useful life (RUL) of a power converter during operation to ensure the reliable and safe operation in aerospace, automotive, space and other mission critical applications and to provide early warning of failure for taking a pro-active action(s). This paper considers the effect of multiple components degradation on performance parameters of power converter. This study proposes a RUL prediction model by utilizing a multivariate-LSTM model to relate deviations in several performance parameters to the RUL. The superbuck power converter is used as a case study. This study follows the k-fold cross technique to validate the proposed RUL prediction model. The findings and comparison show that the multivariate-LSTM model is a better RUL predictive model with high prediction accuracy than other similar deep learning models.

Original languageEnglish
Article number114958
JournalMicroelectronics Reliability
Volume144
DOIs
StatePublished - May 2023

Keywords

  • Deep learning
  • Multi-variate LSTM model
  • Piecewise-linear degradation model
  • Power converter
  • Prognostics and health management
  • RUL prediction

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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