Optoelectronics of Atomic Metal-Semiconductor Interfaces in Tin-Intercalated MoS2

Avraham Twitto, Chen Stern, Michal Poplinger, Ilana Perelshtein, Sabyasachi Saha, Akash Jain, Kristie J. Koski, Francis Leonard Deepak, Ashwin Ramasubramaniam, Doron Naveh

Research output: Contribution to journalArticlepeer-review

Abstract

Metal-semiconductor interfaces are ubiquitous in modern electronics. These quantum-confined interfaces allow for the formation of atomically thin polarizable metals and feature rich optical and optoelectronic phenomena, including plasmon-induced hot-electron transfer from metal to semiconductors. Here, we report on the metal-semiconductor interface formed during the intercalation of zero-valent atomic layers of tin (Sn) between layers of MoS2, a van der Waals layered material. We demonstrate that Sn interaction leads to the emergence of gap states within the MoS2band gap and to corresponding plasmonic features between 1 and 2 eV (0.6-1.2 μm). The observed stimulation of the photoconductivity, as well as the extension of the spectral response from the visible regime toward the mid-infrared suggests that hot-carrier generation and internal photoemission take place.

Original languageEnglish
Pages (from-to)17080-17086
Number of pages7
JournalACS Nano
Volume16
Issue number10
DOIs
StatePublished - 25 Oct 2022

Keywords

  • hot-carrier injection
  • intercalation
  • internal photoemission
  • light-matter interaction
  • metal-semiconductor interface
  • photoconductive gain
  • plasmonic enhancement

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • General Engineering
  • General Physics and Astronomy

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