Abstract
Metal-semiconductor interfaces are ubiquitous in modern electronics. These quantum-confined interfaces allow for the formation of atomically thin polarizable metals and feature rich optical and optoelectronic phenomena, including plasmon-induced hot-electron transfer from metal to semiconductors. Here, we report on the metal-semiconductor interface formed during the intercalation of zero-valent atomic layers of tin (Sn) between layers of MoS2, a van der Waals layered material. We demonstrate that Sn interaction leads to the emergence of gap states within the MoS2band gap and to corresponding plasmonic features between 1 and 2 eV (0.6-1.2 μm). The observed stimulation of the photoconductivity, as well as the extension of the spectral response from the visible regime toward the mid-infrared suggests that hot-carrier generation and internal photoemission take place.
Original language | English |
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Pages (from-to) | 17080-17086 |
Number of pages | 7 |
Journal | ACS Nano |
Volume | 16 |
Issue number | 10 |
DOIs | |
State | Published - 25 Oct 2022 |
Keywords
- hot-carrier injection
- intercalation
- internal photoemission
- light-matter interaction
- metal-semiconductor interface
- photoconductive gain
- plasmonic enhancement
All Science Journal Classification (ASJC) codes
- General Materials Science
- General Engineering
- General Physics and Astronomy