Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology: 2-7 February 2019, San Francisco, California, United States

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Name	Proceedings of SPIE. 5200
Volume	volume 10934

Cite this

@inproceedings{44b6ca6a080348419ba7b7546e9d1e05,

title = "Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology: 2-7 February 2019, San Francisco, California, United States",

author = "Shahriar, {Selim M} and Jacob Scheuer",

year = "2019",

language = "الإنجليزيّة",

isbn = "9781510625105",

series = "Proceedings of SPIE. 5200",

publisher = "SPIE",

booktitle = "SPIE proceedings",

address = "الولايات المتّحدة",

}

TY - GEN

T1 - Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology

T2 - 2-7 February 2019, San Francisco, California, United States

AU - Shahriar, Selim M

AU - Scheuer, Jacob

PY - 2019

Y1 - 2019

M3 - منشور من مؤتمر

SN - 9781510625105

SN - 1510625100

SN - 9781510625112

T3 - Proceedings of SPIE. 5200

BT - SPIE proceedings

PB - SPIE

CY - Bellingham, Washington

ER -